CT/FCT/FLASH UNIVERSAL TEST SYSTEM

For a leading manufacturer of home automation equipment, we developed a universal test system to Test complete product families of jalousie and dimmer applications. This test system includes In-Circuit Test, flashing of the DUTs and complete Functional Test.  Additionally, the build-in RGB LEDs are calibrated in color and brightness. Benefits

• Test simulates the actual system usage thereby minimizing cost and time
• Increased overall test coverage for quality assurance
• Upgradable and high-test accuracy
• It provides a pass/fail determination on finished PCBs thus improving efficiency
• Improved traceability between the requirements, test cases and bugs.
• Reduced risk
• Facilitates reusability of test
• Designed for Speed and performance
• Save floor space on manufacturing site
• As well as true parallel test processing
• Capability to be integrated in many different tester configurations such as small systems up to systems with thousands of nodes per System
• Low cycle time

Properties

• In-circuit test for all electronic parts
• Flashing of firmware, verification of EEPROM content
• CPU programming
• Stimulant via DUT frequency generator up to 40MHz
• Color balancing and calibration of RGB LEDs in color and brightness
• DUT labeling after Test result and serial number management

This test system has been developed to perform production tests of all families of offered switches, switching clock timers, jalousie switches, dimmers and several displays. The customer emphasizes primarily a high accuracy of the color balancing of the used RGB LEDs. All possible colors of all diodes are measured and balanced so that the human eye can ‘t notice any difference in color and brightness. CPU programming has been carried out with several different flash programming devices. Controlling of these devices has been done using software, written in the graphical programming language NI LabVIEW. The used ABex® system guarantees high signal quality due to wireless signal routing and freely configurable switching of all devices onto the integrated bus system. The test system is based on the PXI platform using the ABex® system extension. Software

• NI Test Stand: Test sequencing Editor, Debugger
• NI LabVIEW: Test step library
• KT-OP: Operator panel, Debugging
• KT-Project: ICT, CPU programming, Functional test, LED color check / color balancing
• KT-Stat: Result file viewing and analyzing, Determination of process capability

  Hardware

• PXI test system with ABex (Analog Bus Extension for PXI)

Channels

• 128 – 3000 x 4 busses, non-multiplexed

Tests

• R, L, C, Z, cont., short
• Functional test
• Vision

Instrument

• PXI function generator National Instruments
• PXI DMM 7.5-digit National Instruments
• Reference clock 0,0075ppm accurate
• PXI scope National Instruments

Adaptation

• Automated adapter
• Vacuum adapter

Interface

• Pylon interface