ANAXI UNIVERSAL TEST SYSTEMS

This test system is a typical base setup for many applications testing automotive products, consumer electronic devices, industrial electronics solutions and medical devices.

For maximum test coverage this test system combines different test technologies on one platform, including:

• In-Circuit Test
• Functional Test
• RF-Test
• Boundary Scan Test
• In-System Programming
• Vision Test

Benefits

• Modular designed test systems which can be adjusted to meet specific requirements
• Improved throughput
• Reduce test development time
• Meet increased customers’ expectations
• Scalable and upgradeable software
• capable of testing the functionality across different configurations

The instrumentation of the system is based on the PXI architecture and uses standard boards from Anaxi Technologies, National Instruments and others. Signal connections and routings are implemented without cables using the ABex technology. The interface to the product specific test adapters is established by using reliable Virginia Panel connection technology.

Main Features

Instrumentation in Detail

In-Circuit Test

Up to 2236 test points per 19″ Chassis:

• ICT amplifier Anaxi KT-ICT GenII
• DAQ board National Instruments PXI-6251
• Switching Matrix Anaxi KT-AM-301

Functional Test

For implementing functional test measurement routines, we implemented instruments for NI, Anaxi and other leading companies. Typical measurements include:

• Analog inputs and outputs – static and waveform I/O
• Digital I/O, high speed pattern test
• 6.5-digit DMM
• Scopes
• Waveform generators
• Switching
• Communication protocols like CAN, LIN, MOST, Flex ray, etc.
• custom specific interfaces and protocols

RF-Test

• RF test with PXI up to 6GHz
• Custom designed RF chambers and adapter from Anaxi

Boundary Scan Test

• PXI-based Boundary Scan Controller from leading manufacturers, including JTAG Technologies and Göpel
• Anaxi ABex terminal module for integration of JTAG into ABex

 In-System Programming

• DUT flashing and programming using advanced and production proof Flash Runner programmers from SMH Technologies
• Gang programming
• Multi-site flashing
• Vast support of devices

Vision

Vision libraries for surface inspection, display inspection, character recognition, part detection etc.

Test Adapter

Product specific test adapters are implemented according to customers’ requirements, possible configurations include manual test adapters, optionally equipped with changeable inlays, vacuum adapter, RF adapter. All adapters can be equipped with a Virginia Panel interface.

Power Supply Unit

The universal test system is equipped with the standard power supply module from Anaxi.

• Supply of all necessary voltages
• Emergency breakdown circuit
• Delayed power-on of PXI and Industrial computer

Software

The system is running the NI / Anaxi-based system software, using

• Test Stand
• LabVIEW-based test steps
• Anaxi Operator Interface
• Anaxi KT-STAT Result Data Analysis Software
• Optional tools for automated ICT program generation