ANAXI AEROSPACE HASS TESTSYSTEM

For quality assurance reasons under practical conditions, the so called Stress Screening Tests were developed for the aerospace industry. By so doing , DUTs are exposed to temperature cycles between -40°C to +85°C while shaking the DUTs along several axes. Early failures and manufacturing defects will be detected with high certainty.

The KT- High Accelerated Stress Screening Test System was developed as a standard solution for the aerospace industry and equipped with PXI instruments. These include a 7.5-digit multi meter, various digital I / O boards and multiplexers, CAN interfaces and extensive options for powering DUTs (AC and DC sources for all aviation relevant voltages).

We equiped  this test system with the universal KT-Climatic-Chamber-Server. This allows running climatic profiles with correlated test sequences.  Different climatic chambers from various manufacturers can be interfaced using plug-ins.

The comprehensive software package includes tools for efficient development and production ramp up.

Within a short amount of time test engineers can use the KT Sequence Generator software to automatically generate test sequences, based on requirement documents and test step templates.

With KT-DEMA a library of interactive instrument panels are available, which can directly be integrated in the test program. The execution of test programs in production is done using the KT operator interfaces.

Benefits

• Universal Test System – Supports a wide range of technologies which makes it easily customizable to meet specific customer requirements
• Reduce test time and Time- to – Market thus reducing Cost of Production
• Scalable and Modular implemented test platforms guarantee easy maintenance and throughput balancing
• Flexible – Can be applied to many programming configurations
• Very Reliable – Features ensure efficient  data integrity, uninterrupted process and production flow
• Improved Failure Simulation Configurations
• A special feature of this test system is verification by means of a database for all test procedures. This includes the cross check of the test adapters with each DUT, all relevant test sequences, and parameters