Features
- Modular and scalable test system based on PXI/PXIe and ABex platform
- 19” rack based solution for integration into automation or handling solutions
- Available with 4, 8 or 18 slots
- 86..2838 test points
- Up to 16 fully parallel ICT test sockets in one chassis
- Easy implementation
- Optimized for throughput, reliability, repeatability and cost
- Supports third party PXI and PXIe cards
- Integrated PXI-501 multifunction FCT and ICT measurement instrument
Applications
- In-Circuit Test (ICT)
- Boundary Scan Test (BSCAN)
- In-System Programming (ISP)
- Electrical Functional Test (FCT)
- End of Line Test (EOL)
Software
LEON System software for easy measurement, switching and debugging experience
- Supports NI Teststand and Labview
- ICT development and execution environment
- Aster Testway CAD converter available
- Production operator interface
- Windows DLL API for third party software integration
